Products Description


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Product Specifications
Project | Content |
Product Type | 6", 8", 12" frame wafer |
2D Inspection ltems | Foreign objects, residual glue, particles, scratches, hidden cracks, contamination, CP deviation, excessive area, etc Cutting channel deviation and chipping |
Cassette & Transmission Method | 6", 8", 12" frame cassetee |
WPH | 12" wafers: 31 pieces, 5x configuration/ 8" wafers: 53 pieces, 5x configuration/ 6" wafers: 72 pieces, 5x configuration |
Lens and Resolution | 2 x(2.75um)/5 x(1.1um)/ 7.5 x(0.73um)/10 x(0.55um)/20 x(0.275um) |
Precision | 0.275μm/pixel |
Optional and Customized | INK module, IR module |
Inspectable Area | Front side inspection(standard configuration), back side inspection(customizable) |
