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Hawkeye-WST6055 Wafer 2D Defect Inspection System

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Description
Product Specifications
Products Description

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Product Specifications

Project

Content

Product Type

6", 8", 12" frame wafer

2D Inspection ltems

Foreign objects, residual glue, particles, scratches, hidden cracks, contamination, 

CP deviation, excessive area, etc

Cutting channel deviation and chipping

Cassette & Transmission Method

6", 8", 12" frame cassetee

WPH

12" wafers: 31 pieces, 5x configuration/

 8" wafers: 53 pieces, 5x configuration/

6" wafers: 72 pieces, 5x configuration

Lens and

Resolution

2 x(2.75um)/5 x(1.1um)/

7.5 x(0.73um)/10 x(0.55um)/20 x(0.275um)

Precision

0.275μm/pixel

Optional and Customized

INK module,  IR module

Inspectable Area

Front side inspection(standard configuration), back side inspection(customizable)


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